Tag Archives: transparent conductive films

Deposition and Characterization of Doped Carbon Nanotube Thin Film on Glass Substrate (Published)

The carbon nanotubes (CNTs) as transparent conducting films is the most promising aspects of CNT-based applications due to its optical and electrical properties. The films were prepared using chemical vapour deposition method (CVD).The fabricated thin films were characterized using the profilometry machine, UV-Spectophotometry and Hall effects machine to investigate its optical and electrical properties, thickness of the thin films, sheet resistance, and conductivity. It was observed that higher thin film thickness produce higher conductivity. For the wash and dry samples with the highest thickness of 0.26 nm at 1060C temperature exhibits the highest maximumconductivity σ of 2E 1/Ωcm with relatively smallest sheet resistance of 2.5E + 08Ωcm while the wash at 4000C doped and dry sample show the smallest thickness of thin films of about 0.4 nm with temperature of 1010C. It was observed that the conductivity was 2E-04 1/Ωcm and has a higher sheet resistance of 4.6E + 08Ωcm.

Keywords: carbon nanotube, chemical vapour deposition method UV-Spectophotometry, profilometry machine., transparent conductive films

Deposition and Characterization of Doped Carbon Nanotube Thin Film on Glass Substrate (Published)

The carbon nanotubes (CNTs) as transparent conducting films is the most promising aspects of CNT-based applications due to its optical and electrical properties. The films were prepared using chemical vapour deposition method (CVD).The fabricated thin films were characterized using the profilometry machine, UV-Spectophotometry and Hall effects machine to investigate its optical and electrical properties, thickness of the thin films, sheet resistance, and conductivity. We observed that higher thin film thickness produce higher conductivity. For the wash and dry samples with the highest thickness of 0.26 nm at 1060C temperature exhibits the highest maximum conductivity σ of 2E 1/Ωcm with relatively smallest sheet resistance of 2.5E + 08Ωcm while the wash at 4000C doped and dry sample show the smallest thickness of thin films of about 0.4 nm with temperature of 1010C. It was observed that the conductivity was 2E-04 1/Ωcm and has a higher sheet resistance of 4.6E + 08Ωcm.

Keywords: UV-Spectophotometry, carbon nanotube, chemical vapour deposition method, profilometry machine., transparent conductive films