This paper proposes a generalized two-plan sampling system with multiple repetitive group sampling plan as the reference plan, designated as GTPMRGSS (n; cN, cT), is introduced. The efficiency of GTPMRGSS (n; cN, cT) with respect to smaller sample sizes have been established over the attributes scheme. The sampling inspection scheme will be useful when testing is costly and destructive. The advantages of the sampling inspection scheme over attributes single, double and various reference plans are discussed. Tables are constructed considering various combinations of acceptable and limiting quality levels and with their operating ratios.
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